Dirt Classification of Silicon Wafers Based on Deep Learning
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IOP Conference Series: Earth and Environmental Science
سال: 2021
ISSN: 1755-1315
DOI: 10.1088/1755-1315/632/5/052080